From the atom to the bulk: Materials characterization with CAMECA, Gatan, and EDAX

Venue: AMETEK GmbH, Rudolf-Diesel-Straße 16, 64331 Weiterstadt, Germany
Date: 3 June, 2025

Join CAMECA, Gatan, and EDAX (now part of Gatan) for a workshop showcasing thought leaders in elemental analysis, high-resolution imaging, and new analytical methods for characterizing materials for research and process control. Hear how researchers from the Max Planck Society for the Advancement of Science, University of Freiburg, and others have used mass spectrometry (APT and SIMS) and electron microscopy (SEM and TEM) to advance their research ranging from metallurgy to semiconductors. This one-day workshop is open to novice and expert users alike and will include ample time for networking with experts from CAMECA, Gatan, and EDAX.

Registration Registration, lunch, and refreshments for this in-person event are free, but seats are limited. Register today via the link below to secure your spot. For more information or inquiries, please email info-gatan@ametek.com.

Please fill in all data fields to ensure your registration for the workshop.

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Gatan (EELS, Imaging, CL) *

EDAX (EBSD, EDS, WDS, XRF) *

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Agenda

Time	Title	Speaker	Speaker Affiliation
9:30 – 10:00	Welcome and introduction	Wiebke Rumpf	AMETEK GmbH
10:00 – 10:30	Improving materials characterization by advanced EBSD analysis	Dr. René de Kloe	EDAX (now part of Gatan)
10:30 – 11:00	Quantum leaps in EBSD analysis	Dr. Stefan Zaefferer	Department of Microstructure Physics and Alloy Design, Max Planck Institute for Sustainable Materials
11:00 – 11:30	Coffee break
11:30 – 12:00	Correlative APT-EBSD studies on energy materials	Prof. Dr. Oana Cojocaru-Mirédin	INATECH, Albert Ludwig University of Freiburg
12:00 – 12:30	The TOMO project – Integrating a fully functional atom probe in an abberation-corrected TEM	Prof. Dr. Joachim Mayer	Ernst Ruska – Centre for Microscopy and Spectroscopy with Electrons (ER-C)
12:30 – 13:30	Lunch
13:30 – 14:00	SIMS in material science: An introduction to analyzing thin films, nanostructures, & more	Dr. Stephanie Reiß	CiS Forschungsinstitut für Mikrosensorik GmbH – CiS Analytics Competence Center CAK
14:00 – 14:30	Cryo-APT opens up new possibilities in materials analysis	Dr. Tim Schwarz	Department of Microstructure Physics and Alloy Design, Max Planck Institute for Sustainable Materials
14:30 – 15:00	Coffee break
15:00 – 15:30	Quantitative EPMA and SIMS analysis for industrial coatings	Dr. Kirsten Schiffmann	Head of Department Analytics and Quality Assurance, Fraunhofer Institute for Surface Engineering and Thin Films IST
15:30 – 16:00	Micro- and nanoscale characterization using APT and SIMS	Dr. René Chemnitzer	CAMECA
16:00	Hors d'oeuvres and drinks

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