Date: Thursday, November 6, 2025 Time: 8:00 a.m. PDT | 11:00 a.m. EDT Presenter: Ben Miller, Application Scientist, Gatan
See how Metro counting cameras enable low‑dose electron diffraction and 4D STEM without a beam stop. This webinar shows how electron counting suppresses background noise, expanding dynamic range, and producing high-fidelity patterns, even on highly beam‑sensitive materials. Patterns captured from graphene, zeolite, MOF, and COF samples will be presented. We’ll also show how DigitalMicrograph streamlines acquisition, processing, and visualization, making advanced in-situ diffraction and 4D STEM techniques easy.
If you are unable to attend the live event, a recording will be sent to you via the registration information below.
Please fill in all data fields to register for the webinar.
Comments
The information you provide will be used in accordance with the terms of the Gatan privacy policy.
By submitting this form, I agree to the privacy policy agreement.