Date: Thursday, September 17, 2026 Time: 8:00 a.m. PDT | 11:00 a.m. EDT Presenter: Dr. Ray Twesten, Senior Product Manager, Gatan, Inc.
The F1-GIF™ System represents a new era in electron energy loss spectroscopy (EELS) and energy-filtered transmission electron microscopy (EFTEM), overcoming traditional trade-offs between resolution, spectral coverage, and sample preservation. By combining breakthrough optics with next-generation direct detection, it enables researchers to capture richer chemical and structural information in a single measurement.
In this webinar, discover how the F1-GIF helps address some of today's most demanding materials characterization challenges, from advanced semiconductor devices and beam-sensitive materials to complex multi-component systems. Through real-world applications, you'll see how researchers are gaining deeper insights, accelerating analysis, and revealing information that was previously difficult or impossible to access.
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