Microscopy Conference (MC) 2025
31 August – 4 September 2025
Karlsruhe, Germany
Booth #29
We've built a strong reputation in electron microscopy through curiosity, discovery, and innovation. From revealing the finest details of complex structures to advancing new technologies, our work has helped shape the way scientists understand the world. As we look to the future, we're excited to continue working with our customers to push boundaries, ignite curiosity, and inspire innovation for years to come.
Featured products
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| EDAX Octane Elite Ultra A revolutionary energy dispersive x-ray spectroscopy (EDS) system for compositional analysis in the SEM. Utilizing a newly developed proprietary windowless 160 mm2 EDS detector, it not only delivers superior sensitivity to light and heavy elements but provides accurate analytical results at accelerating voltages up to 30 kV. |
STEMx OIM This package brings orientation mapping analysis to the STEMx® integrated software tools. This is done by comparing the diffraction pattern at each pixel position to a set of simulated patterns for all phases and orientations in your specimen. Orientation data can even be exported to the EDAX OIM Analysis software for further processing. |
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| EDAX OIM Analysis v9.1 The premier microstructural visualization and analysis tool for interrogating and understanding electron backscatter diffraction (EBSD) mapping data. EDAX OIM Matrix™ now includes spherical indexing, which provides superior results by indexing experimentally collected EBSD patterns using master pattern simulations. |
DigitalMicrograph v3.62 New 4D STEM orientation mapping features, custom scan patterns for spectrum imaging, plus live EELS and 4D STEM imaging results with DigitalMicrograph® 3.62. |
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Demonstrations – Gatan booth 29
Check out the newly introduced DigitalMicrograph 3.62 and OIM Analysis 9.1 software.
| Scanning electron microscopy (SEM) | Transmission electron microscopy (TEM) |
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Note, all TEM demonstrations are compatible with eaSI™ Technology. |
Learning sessions – Gatan booth 29
Tuesday, 2 September
| 15:00 – 15:30 | OIM Matrix in action: From routine analysis to the frontier of research René de Kloe, Gatan |
| 15:30 – 16:00 | DigitalMicrograph 4D STEM workflows for orientation mapping Saleh Gorji, Gatan |
Wednesday, 3 September
| 15:00 – 15:30 | Spectrum synergy: The complementary powers of EDS and WDS Julia Mausz, Gatan |
| 15:30 – 16:00 | Direct detection and dose fractionation – An optimized EELS spectrum image acquisition pipeline Liam Spillane, Gatan |
Posters
Monday, 1 September
| 14:00 – 16:00 | Approaching microstructural hydrogen mapping and quantification in a binary system using quantitative backscattered electron imaging and energy dispersive spectroscopy Symposium: MS 2 – Metals and alloys; Poster MS2.P40 Julia Mausz, Gatan |
| 14:00 – 16:00 | Low beam dose analysis using quantitative backscatter electron imaging and EBSD on beam-sensitive lead-based mixed halide perovskites Symposium: MS 1 – Energy-related materials and catalysts; Poster MS1.P49 Julia Mausz, Gatan |
| 14:00 – 16:00 | Extreme low-dose atomic resolution EELS mapping at cryogenic temperature Symposium: IM 1 – Progress in instrumentation and ultrafast EM; Poster IM1.P07 Liam Spillane, Gatan |
| 14:00 – 16:00 | Dose-fractionated K-edge ELNES for compositional and chemical state mapping in transition metals Symposium: IM 2 – Advanced spectroscopy; Poster IM2.P24 Saleh Gorji, Gatan |
| 14:00 – 16:00 | Breaking through EDS limitations – A study on using WDS for silicon wafer contaminant detection Symposium: IM 2 – Advanced spectroscopy; Poster IM2.P19 Shangshang Mu, Gatan |
| 14:00 – 16:00 | Revealing short range order in CeO2 by electron energy loss spectroscopy Symposium: Late breaking posters MS; Poster MSLB.P09 Dr. Julius Bürger, JEOL (Germany) GmbH |
Tuesday, 2 September
| 14:00 – 16:00 | Crystal growth in 5D – In-situ 4D STEM of gold particle crystallization in liquid Symposium: IM 4 – Emerging techniques and applications in 4D STEM; Poster IM4.P31 Ben Miller, Gatan |
| 14:00 – 16:00 | Improved EBSD phase differentiation in fine-grained materials using spherical indexing Symposium: IM 3 – SEM and FIB developments; Poster IM3.P20 René de Kloe, Gatan |
| 14:00 – 16:00 | Dose-fractionated EELS spectrum imaging of cryogenically frozen biological samples Symposium: LS 4 – Correlative microscopy and multimodal microscopy; Poster LS4.P12 Andrew Thron, Gatan |
Wednesday, 3 September
| 14:00 – 16:00 | Utilizing AI for advanced TEM script writing – Benefits and challenges using Microsoft Copilot Symposium: IM 6 – Big data and AI techniques; Poster IM6.P13 Ben Miller, Gatan |
| 14:00 – 16:00 | In situ and operando electron microscopy investigation of Pt surface dynamics under H2 and O2 environments Symposium: MS 7 – Multi-scale and correlative in-situ/operando electron microscopy; Poster MS7.P29 Meimei Wang, TU Munich |
Au sample courtesy of Josh Kacher, GA Tech