Microscopy & Microanalysis (M&M) 2025
July 27 – 31, 2025
Salt Lake City, UT
Booth #1818
We've built a strong reputation in electron microscopy through curiosity, discovery, and innovation. From revealing the finest details of complex structures to advancing new technologies, our work has helped shape the way scientists understand the world. As we look to the future, we're excited to continue working with our customers to push boundaries, ignite curiosity, and inspire innovation for years to come.
Featured products
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EDAX Octane Elite Ultra |
STEMx OIM This package brings orientation mapping analysis to the STEMx® integrated software tools. This is done by comparing the diffraction pattern at each pixel position to a set of simulated patterns for all phases and orientations in your specimen. Orientation data can even be exported to the EDAX OIM Analysis software for further processing. |
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| EDAX OIM Analysis The premier microstructural visualization and analysis tool for interrogating and understanding electron backscatter diffraction (EBSD) mapping data. EDAX OIM Matrix™ now includes spherical indexing, which provides superior results by indexing experimentally collected EBSD patterns using master pattern simulations. |
Metro Counting Camera Series The cutting-edge counting cameras for groundbreaking imaging, diffraction, and in-situ studies. The Metro®, for operating at 60 – 200 kV accelerating voltages, and the new Metro 300, for 120 – 300 kV accelerating voltages, provide imaging for your most sensitive samples and low-dose studies. |
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Demonstrations – Gatan booth 1818
| Scanning electron microscopy (SEM) | Transmission electron microscopy (TEM) |
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Note, all TEM demonstrations are compatible with eaSI™ Technology. |
Learning sessions – Gatan booth 1818
Monday, July 28
| 3:00 – 3:30 p.m. | Precision without compromise: Maximizing energy range and resolution with minimal dose Liam Spillane, Gatan |
| 3:30 – 4:00 p.m. | Direct detection diffraction data: Delivering results with Metro Ben Miller, Gatan |
Tuesday, July 29
| 3:00 – 3:30 p.m. | DigitalMicrograph 4D STEM workflows for orientation mapping Fernando Castro, Gatan |
| 3:30 – 4:00 p.m. | Discover the power and performance of spherical indexing for EBSD Matt Nowell, Gatan |
Wednesday, July 30
| 3:00 – 3:30 p.m. | Can a large area windowless EDS detector really be suitable for everyday use and reliable and robust? David Stowe, Gatan |
Vendor tutorials – Gatan booth 1818
Tuesday, July 29
| 5:45 – 6:45 p.m. | Discover how to maximize data quality with spherical indexing Matt Nowell, Gatan |
| 5:45 – 6:45 p.m. | Python-powered applications: Practical script writing for modern TEM hardware Ben Miller, Gatan |
Wednesday, July 30
| 5:45 – 6:45 p.m. | Elevating EELS: Maximizing data integrity through dose fractionation Andrew Thron, Gatan |
| 5:45 – 6:45 p.m. | Introduction to STEMx OIM and established 4D STEM workflows in DigitalMicrograph Fernando Castro, Gatan |
Platform presentations
Tuesday, July 29
| 11:15 – 11:30 a.m. | Collection of quasi-kinematical 4D STEM data with DigitalMicrograph Symposium: A09.2 – Quantitative electron diffraction; Room 150 DEF Fernando Castro, Gatan |
| 11:30 – 11:45 a.m. | Streamlining cathodoluminescence data collection and analysis using autonomous control Symposium: C03.2 – Microscopy and microanalysis in industry; Room 251 C Douglas Cameron, Gatan |
| 11:30 – 11:45 a.m. | Dose-fractionated spectrum imaging for the analysis of organic and inorganic interfaces Symposium: C01.3 – Microscopy and microanalysis of interfaces and/or interactions among organic and inorganic matter; Room 251 D Andrew Thron, Gatan |
| 11:45 a.m. – 12:00 p.m. | Enhancing semiconductor wafer inspection: Resolving peak overlap with simultaneous EDS-WDS analysis Symposium: C03.2 – Microscopy and microanalysis in industry; Room 251 C Shangshang Mu, Gatan |
| 2:00 – 2:15 p.m. | Fast Kikuchi spheres for forward model EBSD indexing Symposium: A09.3 – Quantitative electron diffraction; Room 150 DEF Will Lenthe, Gatan |
| 2:15 – 2:30 p.m. | Sensitivity study of parameters surrounding spherical indexing of electron backscatter diffraction patterns Symposium: A09.3 – Quantitative electron diffraction; Room 150 DEF Stuart Wright, Gatan |
Wednesday, July 30
| 9:15 – 9:30 a.m. | Low-dose programmable scanning patterns for correlative ptychography and EELS in ferroelectric thin films Symposium: A02.5 – Frontiers in ptychography; Ballroom D Mariana Palos, Imperial College London |
| 9:30 – 9:45 a.m. | Real-time in-situ insights: Dynamic mapping with 4D STEM Symposium: P10.5 – Innovative in-situ imaging techniques for material characterization, synthesis, and processing; Room 150 DEF Ben Miller, Gatan |
| 11:15 – 11:30 a.m. | Characterization of dilute Mn implantation in Bi2Se3 films via 4D STEM and EELS Symposium: A03.2 – When 4D STEM meets more dimensions: Deepening materials insights with efficient experimental design and smart computational microscopy; Ballroom A Tigran Simonian, Imperial College London |
| 2:00 – 2:15 p.m. | Non-local denoising for 4D STEM orientation mapping Symposium: A09.6 – 4D STEM, precession electron diffraction and materials applications II; Room 150 DEF David Rowenhorst, US Naval Research Laboratory |
Thursday, July 31
| 2:15 – 2:30 p.m. | EBSD pattern center fitting with particle swarm optimization Symposium: A09.8 – In-situ high-resolution EBSD and pattern center calibration; Room 150 DEF David Rowenhorst, US Naval Research Laboratory |
Posters
Tuesday, July 29
| 3:00 – 5:00 p.m. | Revisiting the effects of sample preparation on EBSD performance in the era of forward model indexing Symposium: A09.P1 – Quantitative electron diffraction for materials analysis, from transmission electron diffraction to EBSD and ECCI; Poster 133 Matt Nowell, Gatan |
Thursday, July 31
| 10:00 a.m. – 12:00 p.m. | In-situ 4D STEM: Capturing 5D insights into material dynamics in liquid Symposium: A03.P1 – When 4D STEM meets more dimensions: Deepening materials insights with efficient experimental design and smart computational microscopy; Poster 356 Ben Miller, Gatan |
| 10:00 a.m. – 12:00 p.m. | Optimizing 4D STEM data collection and processing for crystal orientation mapping analysis in DigitalMicrograph Symposium: A03.P1 – When 4D STEM meets more dimensions: Deepening materials insights with efficient experimental design and smart computational microscopy; Poster 367 Fernando Castro, Gatan |
| 10:00 a.m. – 12:00 p.m. | Low-dose atomic resolution EELS mapping at cryogenic temperature Symposium: A10.P1 – Advances in cryogenic transmission electron microscopy and spectroscopy for energy and quantum materials and technologies; Poster 396 Liam Spillane, Gatan |
Au sample courtesy of Josh Kacher, GA Tech