Microscience Microscopy Congress (MMC) 2025
1 – 3 July, 2025
Manchester, United Kingdom
Stand #421
We've built a strong reputation in electron microscopy through curiosity, discovery, and innovation. From revealing the finest details of complex structures to advancing new technologies, our work has helped shape the way scientists understand the world. As we look to the future, we're excited to continue working with our customers to push boundaries, ignite curiosity, and inspire innovation for years to come.
Featured products
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| EDAX Octane Elite Ultra EDAX Octane Elite Ultra is a revolutionary energy dispersive x-ray spectroscopy (EDS) system for compositional analysis in the SEM. Utilizing a newly developed proprietary windowless 160 mm2 EDS detector, it not only delivers superior sensitivity to light and heavy elements but provides accurate analytical results at accelerating voltages up to 30 kV. |
STEMx OIM The STEMx® OIM package brings orientation mapping analysis to the STEMx integrated software tools. This is done by comparing the diffraction pattern at each pixel position to a set of simulated patterns for all phases and orientations in your specimen. Orientation data can even be exported to the EDAX OIM Analysis software for further processing. |
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| EDAX OIM Analysis EDAX OIM Analysis™ is the premier microstructural visualization and analysis tool for interrogating and understanding electron backscatter diffraction (EBSD) mapping data. EDAX OIM Matrix™ now includes spherical indexing, which provides superior results by indexing experimentally collected EBSD patterns using master pattern simulations. |
Metro Counting Camera Series The cutting-edge counting cameras for groundbreaking imaging, diffraction, and in-situ studies. The Metro®, for operating at 60 – 200 kV accelerating voltages, and the new Metro 300, for 120 – 300 kV accelerating voltages, provide imaging for your most sensitive samples and low-dose studies. |
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Commercial workshop
Gain in-depth knowledge about techniques and analyses that can help advance your research. The presentation will be in the Workshop 1 room on the exhibition floor.
Tuesday, 1 July
| 12:00 – 12:30 | Direct detection and dose fractionation – An optimized EELS spectrum image acquisition pipeline Liam Spillane, Gatan |
Learning sessions – Gatan stand 421
Tuesday, 1 July
| 15:30 – 16:00 | When less is more – Reducing dose, damage, and duration with counted EELS Liam Spillane, Gatan |
Wednesday, 2 July
| 15:30 – 16:00 | Spherical indexing in EBSD: Precision meets performance René de Kloe, Gatan (formerly EDAX) |
Presentations
Wednesday, 2 July
| 14:45 – 15:00 | The application of spherical models of EBSD patterns for forward modelling indexing Symposium: EBSD technique: Advances in data collection and processing – Charter 4 René de Kloe, Gatan (formerly EDAX) |
| 15:00 – 15:15 | Low-dose programmable scanning patterns for correlative ptychography and EELS in ferroelectric thin films Symposium: High resolution EM (1) – Charter 3 Mariana Palos, Imperial College of London |
| 15:45 – 16:00 | Ultra low-dose atomic resolution EELS mapping at cryogenic temperature Symposium: Beam sensitive materials – Charter 1 Liam Spillane, Gatan |
Posters
Tuesday, 1 July
| 16:30 – 18:30 | Leveraging new scripting capabilities in DigitalMicrograph for automated data acquisition and analysis of nanoparticles Poster session one – Poster 1028 Zaeem Najeeb, Johnson Matthey Technology Centre |
Wednesday, 2 July
| 16:15 – 18:15 | Streamlining cathodoluminescence data collection and analysis using autonomous control Poster session two – Poster 2005 Douglas Cameron, Gatan |
| 16:15 – 18:15 | High-resolution orientation mapping via 4D STEM and DigitalMicrograph Poster session two – Poster 2007 Fernando Castro, Gatan |
Au sample courtesy of Josh Kacher, GA Tech