MMC 2025

International Microscopy Congress (IMC) 2026

31 August – 3 September, 2026
Liverpool, UK
Stand #333

We’ve built a strong reputation in electron microscopy by enabling deeper insight and more confident analysis. From revealing the finest details of complex structures to advancing new technologies, our work has helped elevate how scientists understand and interpret the world. As we look to the future, we’re excited to continue working with our customers to push boundaries and elevate their analysis for years to come.

 

   

 

The future of EELS is here

New generation Gatan Imaging Filter (GIF)

Join us as we share insights into our next generation energy filter that fundamentally changes the possibilities of materials research, and welcome in the new era of science powered by electron energy loss spectroscopy (EELS). Register to reserve your spot at our "Igniting a new era of science" learning session reception event on Monday, 31 August at 17:30.

 

PECS III System   Ilion III System

PECS III System
The PECS™ III is a broad-beam argon ion milling system that delivers consistent, high-quality surface preparation for complex, multi-material samples across semiconductors, batteries, and advanced materials through a streamlined, integrated workflow.

 

Ilion III System
The Ilion® III is a tabletop broad beam argon milling system that delivers consistent, high-quality cross-section preparation for diverse, complex, and fragile materials while preserving true microstructural detail.

 
Double-Tilt Liquid Nitrogen Cooling Holder, Model 1697   APEX Particle Software

Double-Tilt Liquid Nitrogen Cooling Holder, Model 1697
The next‑generation double‑tilt cryo‑holder enables precise, reliable in‑situ cryogenic electron microscopy for advanced studies of quantum, functional, and beam‑sensitive materials, supporting deeper insight into temperature‑dependent phenomena.

 

APEX Particle Software
The APEX™ Particle module streamlines microanalysis with intuitive, recipe-based automation and unattended operation, delivering fast, repeatable results and high-throughput, accurate particle characterization.

 
EDAX OIM Analysis   DigitalMicrograph v3.6.3

EDAX OIM Analysis v9.2
Introducing EBSD strain analysis into the EDAX OIM Analysis ecosystem for streamlined and reliable materials characterization.

 

DigitalMicrograph v3.63
Version 3.63 introduces STEMx® Precession to acquire precession-assisted 4D STEM data in DigitalMicrograph® and expands the orientation analysis feature set for STEMx OIM.

 

Demonstrations – Gatan stand 333

Check out the newly introduced DigitalMicrograph 3.63 and OIM Analysis 9.2 software.

Scanning electron microscopy (SEM) Transmission electron microscopy (TEM)
  • EDAX OIM Analysis
  • DigitalMicrograph 3.63 data analysis*
  • EDAX OIM Matrix™*
  • DigitalMicrograph (EELS)
  • EDAX APEX™ Software for EDS
  • DigitalMicrograph (EDS)
  • EDAX APEX Software for EBSD
  • DigitalMicrograph (4D STEM, STEMx OIM)*
  • EDAX APEX Particle Analysis
  • DigitalMicrograph (Imaging - includes in-situ)
Standalone
  • DigitalMicrograph (Python integration)
  • EDAX Orbis™ II Micro-XRF System
 
   
*Demonstratees are encouraged to submit their datasets ahead of the show.
Note, all TEM demonstrations are compatible with eaSI™ Technology.

 

Register for a demo!

 


Learning sessions – Gatan stand 333

Monday, 31 August

17:30 – 18:30 Igniting a new era of science – Product introduction and reception
Ray Twesten, Gatan

Tuesday, 1 September

17:30 – 18:00 Strain analysis with EBSD in OIM Analysis
René de Kloe, Gatan
18:00 – 18:30 4D STEM analysis in DigitalMicrograph
Ana Pakzad, Gatan

Wednesday, 2 September

17:30 – 18:00 Accelerating your microanalysis with APEX EDS software: From quantitative elemental mapping to particle analysis
David Stowe, Gatan
18:00 – 18:30 DigitalMicrograph automation: From basic scripts to AI-driven solutions
Liam Spillane, Gatan

 


Scientific talks

Monday, 31 August

14:55 – 15:10 High-throughput atomic-scale characterisation of industrial catalyst development
Symposium: Innovating microscopy end-to-end: Hardware, automation and AI in honour of Albert Crewe; Room 3B
Zaeem Najeeb, University of Oxford/Johnson Matthey Technology Centre
17:15 – 17:30 Precession-assisted 4D STEM for multimodal EELS and strain mapping analysis
Symposium: Electron diffraction and 4D STEM; Room 2E (Hall 2)
Liam Spillane, Gatan

Tuesday, 1 September

16:45 – 17:00 Pushing the limits of spectroscopy: Atomic-resolution chemical mapping and structural analysis at high energy loss by EELS
Symposium: Advances in spectroscopy and spectral imaging techniques; Room 2L (Hall 2)
Peter van Aken, Max Planck Institute for Solid State Research

Wednesday, 2 September

12:05 – 12:20 Closing the loop towards automated in-situ 4D STEM and 4D STEM mapping
Symposium: Innovating microscopy end-to-end: Hardware, automation and AI in honour of Albert Crewe; Room 3B
Fintan Hardy, Imperial College London
14:55 – 15:10 Quantitative SEM assessment of lithium-containing phases in indium and graphite battery anodes
Symposium: Energy storage and conversion; Room 1C (Auditorium)
David Stowe, Gatan
17:15 – 17:30 From prompts to pipelines: Metadata-aware Copilot agents for Python scripting in DigitalMicrograph
Symposium: Innovating microscopy end-to-end: Hardware, automation and AI in honour of Albert Crewe; Room 3B
Ana Pakzad, Gatan

 


Posters

Tuesday, 1 September

17:30 – 18:30 Enhancing EBSD accuracy and strain mapping using forward-model diffraction methods
Poster Session 2; Poster IP2 098
René de Kloe, Gatan
17:30 – 18:30 From patterns to profiles: Real-time python processing of in-situ SAED in DigitalMicrograph
Poster Session 2; Poster IP2 094
Ana Pakzad, Gatan

Wednesday, 2 September

17:30 – 18:30 Improving analysis of phase relationships in oxidised stainless steel using EBSD spherical indexing
Poster Session 3; Poster PP3 774
René de Kloe, Gatan
17:30 – 18:30 Nanoparticle nucleation and growth in liquid phase: Dose-controlled multimodal STEM with synchronized pre-specimen electrostatic beam blanking
Poster Session 3; Poster IP3 159
Liam Spillane, Gatan
17:30 – 18:30 Dose-fractionated atomic-resolution counted EELS mapping of high-entropy oxides
Poster Session 3; Poster IP3 033
Ray Twesten, Gatan
17:30 – 18:30 Optical properties of dislocations in diamond
Poster Session 3; Poster IP3 025
Douglas Cameron, Gatan

Thursday, 3 September

17:30 – 18:30 Dynamic electrostatic refocusing: An effective strategy for overcoming chromatic aberration in core-loss EELS
Poster Session 4; Poster IP4 044
Catriona McGilvery, Imperial College London
17:30 – 18:30 Achieving high spatial selectivity with high-energy electron energy loss spectroscopy
Poster Session 4; Poster IP4 057
Andrew Thron, Gatan

Ni data courtesy of Yichen Yang and Josh Kacher, Georgia Tech