Microscopy & Microanalysis (M&M) 2026
August 2 – 6, 2026
Milwaukee, WI
Booth #809
We’ve built a strong reputation in electron microscopy by enabling deeper insight and more confident analysis. From revealing the finest details of complex structures to advancing new technologies, our work has helped elevate how scientists understand and interpret the world. As we look to the future, we’re excited to continue working with our customers to push boundaries and elevate their analysis for years to come.
The future of EELS is here
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Join us as we share insights into our next generation energy filter that fundamentally changes the possibilities of materials research, and welcome in the new era of science powered by electron energy loss spectroscopy (EELS). Register to reserve your spot at our "Igniting a new era of science" vendor tutorial launch event on Monday, August 3 at 5:45 p.m. |
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Featured products
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PECS III System |
Ilion III System |
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Double-Tilt Liquid Nitrogen Cooling Holder, Model 1697 |
APEX Particle Software |
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EDAX OIM Analysis v9.2 |
DigitalMicrograph v3.6.3 |
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Demonstrations – Gatan booth 809
Check out the newly introduced DigitalMicrograph 3.6.3 and OIM Analysis 9.2 software.
| Scanning electron microscopy (SEM) | Transmission electron microscopy (TEM) |
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Standalone |
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| *Demonstratees are encouraged to submit their datasets ahead of the show. | |
| Note, all TEM demonstrations are compatible with eaSI™ Technology. | |
Learning sessions – Gatan booth 809
Monday, August 3
| 3:15 – 3:45 p.m. | STEMx Precession: An introduction to precession-assisted 4D STEM data acquisition in DigitalMicrograph Fernando Castro, Gatan |
| 3:45 – 4:15 p.m. | Direct detection: From SAED to in-situ 4D STEM with Metro Ben Miller, Gatan |
Tuesday, August 4
| 3:15 – 3:45 p.m. | Introducing 1697: Next-generation double-tilt cryo-holder for high-resolution S/TEM Ana Pakzad, Gatan |
| 3:45 – 4:15 p.m. | Strain analysis with EBSD in OIM Analysis Matt Nowell, Gatan |
Wednesday, August 5
| 2:00 – 3:00 p.m. | Integrating the JED and EBSD for simultaneous elemental and structural characterization (at JEOL booth 504) René de Kloe, Gatan |
| 3:15 – 3:45 p.m. | Accelerating your microanalysis with APEX EDS software: From quantitative elemental mapping to particle analysis David Stowe, Gatan |
| 3:45 – 4:15 p.m. | Automating EBSD workflows with Python and OimPy Will Lenthe, Gatan |
Vendor tutorials – Gatan booth 809
Monday, August 3
| 5:45 – 6:45 p.m. | Igniting a new era of science The future of electron energy loss spectrometers is here. Join us as we share insights into our next generation energy filter that fundamentally changes the possibilities of materials research, and welcome in the new era of science powered by electron energy loss spectroscopy (EELS). Ray Twesten, Gatan |
Tuesday, August 4
| 5:45 – 6:45 p.m. | DigitalMicrograph automation: From basic scripts to AI-driven solutions This vendor tutorial presents examples of Python scripting in DigitalMicrograph for data processing, organization, and acquisition. We will show how to download many of these scripts from the Gatan website, adapt them, and run them in our free Python interpreter. We will also demonstrate Jupyter notebook workflows enabled in the upcoming DigitalMicrograph 3.6.3 release. Finally, we will discuss using AI agents to quickly generate DigitalMicrograph scripts. Applications will range from live in-situ video processing during acquisition to iterative multi-slice ptychographic reconstruction using open-source code. Ben Miller and Liam Spillane, Gatan |
Wednesday, August 5
| 5:45 – 6:45 p.m. | 4D STEM orientation analysis with new developments in STEMx OIM This vendor tutorial will walk through using STEMx OIM to generate orientation maps in DigitalMicrograph and highlight new STEMx OIM features coming in DigitalMicrograph 3.6.3. Fernando Castro, Gatan |
Platform presentations
Monday, August 3
| 2:30 – 2:45 p.m. | Fast HR-EBSD-based pattern center calibration Symposium: C05.1 – Innovative approaches to microstructural analysis: EBSD, ECCI, and 3D techniques across disciplines; Room S103 E Will Lenthe, Gatan |
Tuesday, August 4
| 9:00 – 9:15 a.m. | The universal k-ratio: A concept for interlaboratory comparability of chemical analysis data, with examples for Mg and Si Symposium: P10.2 – Quantitative microanalysis of terrestrial and planetary samples by electrons, x-rays, ions, and lasers; Room S202 A William Nachlas, University of Wisconsin-Madison |
| 10:30 – 11:00 a.m. | Novel workflows in cryogenic sample preparation of beam-sensitive materials Symposium: A04.2 – Advances in cryogenic electron microscopy for energy and quantum materials; Room S103 B Eric Woods, Max Planck Institute for Sustainable Materials GmbH |
Wednesday, August 5
| 8:45 – 9:00 a.m. | Leveraging large language models to lower barriers to Python-based automated electron microscopy Symposium: A10.4 – Recent developments and new emergent applications in hardware, accessories, and software tools; Room S202 D Ben Miller, Gatan |
| 9:00 – 9:15 a.m. | Optimized electrostatic beam blanking for dose-controlled liquid phase in-situ STEM: Imaging, EELS, and 4D STEM of Au nanoparticle growth dynamics Symposium: P06.5 – Technical and application advances in liquid and gas phase TEM; Room S103 D Liam Spillane, Gatan |
| 9:45 – 10:00 a.m. | Micro-XRF characterization of SEM coatings deposited by a broad argon ion beam tool Symposium: A08.2 – Microscopy and microanalysis for real world problem solving; Room S202 A Shangshang Mu, Gatan |
| 9:45 – 10:00 a.m. | Terabytes without tears: Scalable continuous in-situ 4D STEM and EELS Symposium: P06.5 – Technical and application advances in liquid and gas phase TEM; Room S103 D Ben Miller, Gatan |
| 10:30 – 11:00 a.m. | Multimodal STEM analysis of semiconductor devices at low kV: Dose-efficient wide-range EELS and 4D STEM at extended camera length Symposium: P03.6 – Advanced TEM analysis for semiconductors; Room S102 E Liam Spillane, Gatan |
| 11:15 – 11:30 a.m. | New scan strategies for spectrum image acquisition of dose-constrained materials Symposium: C01.2 – Transmission electron microscopy for beam-sensitive materials; Room S202 C Andrew Thron, Gatan |
| 2:30 – 2:45 p.m. | Improving the accessibility and performance of deformation, defect, and strain analysis with electron backscatter diffraction (EBSD) Symposium: P05.7 – Advances in electron microscopy for defect and crystallographic structure analysis; Room S202 C Matt Nowell, Gatan |
Thursday, August 6
| 9:00 – 9:15 a.m. | Closing the feedback loop: Live polarization analysis for automated in-situ 4D STEM and SEM Symposium: C04.3 – Living on the edge: Real-time processing and decision making at the microscope; Room S103 D Fintan Hardy, Imperial College London |
Posters
Monday, August 3
| 3:00 – 5:30 p.m. | EBSD of vitrified cryo-TEM specimens: Grid quality assessment step for cryo-TEM for lamella and APT specimen preparation Symposium: C05.P1 – Innovative approaches to microstructural analysis: EBSD, ECCI, and 3D techniques across disciplines; Poster 37 Eric Woods, Max Planck Institute for Sustainable Materials GmbH |
| 3:00 – 5:30 p.m. | The challenges of standardless quantification of light elements by EDS-XRF Symposium: P10.P1 – Quantitative microanalysis of terrestrial and planetary samples by electrons, x-rays, ions, and lasers; Poster 73 Aurelien Moy, Gatan |
| 3:00 – 5:30 p.m. | SEM study of lithium-containing microstructures for battery and biomedical technologies Symposium: C05.P1 – Innovative approaches to microstructural analysis: EBSD, ECCI, and 3D techniques across disciplines; Poster 39 David Stowe, Gatan |
| 3:00 – 5:30 p.m. | High-precision micro-xrf for forensic glass comparison: A study of cross-generation consistency and efficiency Symposium: A01.P1 – Advancements in forensic chemistry: Microscopy and microanalysis techniques; Poster 5 Shangshang Mu, Gatan |
Tuesday, August 4
| 3:00 – 5:30 p.m. | Local glass composition and microstructure mitigate PID failure in silicon solar cells: A multimodal in-situ biasing study Symposium: A06.P1 – Correlative, multimodal microscopy, spectroscopy, and imaging; Poster 117 Steven Hayden, National Lab of the Rockies |
| 3:00 – 5:30 p.m. | Enhanced multimodal workflow capabilities with EELS and precession-assisted 4D STEM Symposium: A02.P1 – Advances in 4D STEM experimentation, analysis, and interpretation; Poster 88 Ana Pakzad, Gatan |
Wednesday, August 5
| 3:00 – 5:30 p.m. | Systematic evaluation of the Gatan Alpine camera for cryo-EM at lower voltages Symposium: B04.P1 – Technical advances and transformative applications of cryo-EM; Poster 231 Alex Flynn, New York Structural Biology Center |
| 3:00 – 5:30 p.m. | From low-dose to high-kV: A large area windowless SEM-EDS approach for real-world materials analysis Symposium: A08.P1 – Microscopy and microanalysis for real-world problem solving; Poster 193 David Stowe, Gatan |
Ni data courtesy of Yichen Yang and Josh Kacher, Georgia Tech